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Jio Institute Research Publication Archive
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Low-Temperature ALD of SbOx/Sb2Te3 Multilayers with Boosted Thermoelectric Performance
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Identity verification using palm print microscopic images based on median robust extended local binary pattern features and k‐nearest neighbor classifier
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Fabian Krahl
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Artificial Intelligence and Data Analytics Research Lab (AIDA) CCIS Prince Sultan University, Riyadh, Saudi Arabia.
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Atomic layer deposition
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Binary pattern
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Interface engineering
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Legal identity for all
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